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Biometric Vulnerability Assessment Expert Group (BVAEG)

In May 2010, the Biometrics Institute formed the Biometrics Vulnerability Assessment Expert Group (BVAEG). The Group was established to raise awareness about the importance of biometric vulnerability assessments and to exchange knowledge and experiences. Its overall mission is to reduce vulnerabilities in biometrics.

A first Biometric Vulnerability Assessment workshop will be held on the 29 April 2013. Please send expressions of interest for participation to us.

The BVAEG currently includes the following participants:

  • Isabelle Moeller, Chief Executive, Biometrics Institute* (Co-ordinator)
  • Ted Dunstone, Biometix*
  • Geoff Poulton, GP Research*
  • Tony Mansfield, National Physical Laboratory (NPL)*
  • Nigel Gordon, Communications Electronic Securities Group (CESG) - UK Biometrics Working Group (BWG)*
  • Raul Sanchez-Reillo, University Carlos III of Madrid (UC3M) - Electronic Technology Department*
  • Raph Breithaupt, Federal Office for Information Security, Germany (Bundesamt for Sicherheit in der Informationstechnik BSI)*
  • Elaine Newton, National Institute of Standards and Technology (NIST)
  • Patrick Grother, NIST 
  • Tsutomu Matsumoto, Yokohama National University, Japan
  • Christophe Champod, University of Lausanne - Institut de Police Scientifique, Switzerland 
  • Sébastien Marcel, Senior Researcher, Idiap Research Institute 
  • Fares Rahmun, Bundesverwaltungsamt, Germany 

* Founding participants

Aim:

  • Raise awareness about the importance of vulnerability assessments and that mitigation is available
  • Share knowledge, research and experience about vulnerabilities on an ongoing basis
  • Support development of a common standard and align to SC37
  • Have a common basis for methodology and put experiences it has in practice together

Participation:

Participation is by invitation only and Members need to demonstrate their expertise in the field of biometric vulnerability assessments through publication or work in the field. The members are drawn from different countries to have a good balance of information.

Meeting Schedule for the BVAEG

March 2014 - Gaithersburg
29 April 2013 - One day workshop (invitation only), London following the SC37 Meeting
2 November 2012 - London
July 2012 - Paris during the SC37 Meeting
27 June 2012 - London, UK (to be confirmed) following the Biometrics Institute Technology Showcase Europe event
5 March 2012 - Gaithersburg, USA
21 October 2011 - London: One-day by invitation-only Meeting including presentations from members and guests.
9 Sept 2011 - Tampa, Florida
15 July 2011 - following the Inaugural Biometrics Institute Singapore Meeting and the SC37 Meeting in Japan