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Introduction to Face Biometrics Workshop

21 June, 09:00-12:00

Mary Gates Center

DATE

21 June 2022

TIME

9:00 (EDT)

DURATION

Three hours, including a short break

LOCATION

Alexandria, USA

ABOUT THE WORKSHOP

This online workshop is designed to present a short overview of the primary issues in face biometrics.

The event is planned for persons looking for a quick introduction to the history, fundamentals, standards, performance capabilities, new developments, and case studies of face biometric systems. Although materials are of a technical nature, mathematical development is avoided in favour of a qualitative description of these systems and their fundamentals.

  1. What is automated “human recognition”?
  2. What is a “face”?
  3. What is the technical history of automated face recognition?
  4. How did we arrive at convolutional neural networks?
  5. What standards exist?
  6. How is performance of automated human recognition measured?
  7. How is performance tested?
  8. Why some proposed performance metrics make no sense 
  9. Human factors, human factors and human factors 
  10. The history of presentation attack detection, morphing and face recognition software. 
  11. A review of the Information Commissioner’s report on face recognition. 

WORKSHOP PRESENTER

James Wayman received the Ph.D. degree in engineering in 1980 from the University of California, Santa Barbara, and has worked continuously in the field of automated human recognition since 1984. 

In the 1980s, under contract to the US Department of Defense, he invented and developed a biometric authentication technology based on the acoustic resonances of the human head.

He served as Director of the US National Biometric Test Center from 1997-2000.  He is co-editor of J.Wayman, A. Jain, D. Maltoni and D.Maio (eds) Biometric Systems (Springer, London, 2005), a Fellow of the British Institution of Engineering and Technology and the Institute of Electronic and Electrical Engineers, a Principal UK Expert (PUKE) of the British Standards Institution (BSI) national body to the ISO/IEC JTC1 SC37 biometric standards committee,  an IEEE “Distinguished Lecturer”,  and the former editor of the ISO/IEC 19794-3 Finger Pattern Spectral Data Format , ISO/IEC 19794-13 voice data format, and the ANSI/NIST Type-11 “Voice Data Record”. He serves as the Honorary Editor-in-Chief of the journal IET Biometrics,  is the author or co-author of 37 peer-reviewed journal articles and book chapters and a paid advisor to 13 national governments.

WHO SHOULD ATTEND?

End-users, integrators, application developers and others interested in an introduction to the history, fundamentals, standards, performance capabilities, new developments and case studies of face biometric systems.

REGISTRATION FEES

Members: USD 400 
Non-members: USD 650 

REGISTRATION

To register, please complete the registration form below.

Attendance requirements

The health and safety of our guests and team members is our top priority. We continue to monitor government advice about COVID-19 precautions and current legislation.

Mouth-nose protection is mandatory at the venue. Face coverings can be removed when you are drinking or eating or presenting at the event.

In the interest of everyone’s safety, please also refrain from attending if you feel unwell, have COVID-19 symptoms, or have had close contact with someone with a recent positive COVID-19 result.

IMPORTANT DISCLAIMER NOTIFICATION

The Biometrics Institute provides training and course material as a tool to help you conduct due diligence. While the institute has used reasonable care to ensure the accuracy of the material and course, due to the content and variable inputs during and after the process of implementing biometrics, the institute cannot be held accountable for outcomes or compliance. The material and course have been prepared for informational purposes only and are not intended to provide legal or compliance advice. You should consult your legal advisor should you require advice on the legal or compliance aspects of the material or course. 


 

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